1
赞
良率提升：1.建立数据采集体系 2.WAT/CP测试数据整合 3.Defect Density分析 4.批次追溯。Pareto分析，鱼骨图分析根因。...
admin
2026-06-24
140 浏览
0 回复
0
赞
Yield Management System (YMS) provides: Wafer-level yield analysis, Defect mapping, Process window optimization, Lot traceability. Use Spark for batch, Flink fo...
admin
2026-06-24
222 浏览
3 回复
0
赞
良率提升：1.建立数据采集体系 2.WAT/CP测试数据整合 3.Defect Density分析 4.批次追溯。Pareto分析，鱼骨图分析根因。...
admin
2026-06-18
122 浏览
0 回复